| 摘要 |
<p>PURPOSE:To ship an LSI device ensured in its high frequency characteristics by comparing the data outputted from a logical circuit with the expected value data corresponding to test data in an external testing means to perform a test. CONSTITUTION:In this semiconductor integrated circuit device, for example, a circuit 10 oscillating a high frequency clock and a circuit 20 selecting the high frequency clock are used in a chip. The clock CLKS wherein two kinds of the through-mode clock and two-pulse mode clock selected and outputted from the clock selecting circuit 20 is used to reject the abnormality of the delay (a part shown by hatching) of the Q-output of a flip-flop 34. In this case, though the use frequency of an LSI tester is as low as 60MHz, the inferiority of high frequency of 600MHz can be partially rejected.</p> |
