METHOD OF MEASURING THERMAL CONDUCTIVITY OF SEMICONDUCTORS,申请号SU19884647441-传众专利搜索

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发明名称	METHOD OF MEASURING THERMAL CONDUCTIVITY OF SEMICONDUCTORS
摘要
申请公布号	SU1636753(A1)	申请公布日期	1991.03.23
申请号	SU19884647441	申请日期	1988.12.26
申请人	SP K BYURO "TELLUR" S O PROIZV IFIZ AN AZSSR	发明人	GRYADUNOV ALEKSANDR I,SU
分类号	G01N25/18	主分类号	G01N25/18
代理机构		代理人
主权项
地址

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