发明名称 |
Bipolar transistor with large band-gap emitter material - uses single crystalline silicon as emitter and collector and forms base-region from silicon-germanium cpd. |
摘要 |
The bipolar transistor uses as base-region (2) a Si-Ge cpd., with the compsn. Si(X)Ge(1-X) and a value of X from 0.05-0.2 (0.1), which has been deposited by low pressure vapour phase epitaxy (LPVPE). The emitter (3) material is single crystalline Si, pref. deposited after the base-material by LPVPE. The selective depsn. of base and emitter regions is achieved by using a masking layer (4,5) of thermal or pyrolytically deposited SiO2 or of Si-nitride. USE/ADVANTAGE - The construction combines the advantages of an emitter material with a larger bandgap than the base-material with that of good lattice-fit allowing single crystalline material, to be used. This results in low leakage currents and lower resistivity. The emitter, doped e.g. to a level of 10 power 17 cm (-3), has a gap of 1.1 Ev, the base material has a gap of 1.0 Ev. The devices are used for HF operation or as fast switching transistors.
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申请公布号 |
DE3930536(A1) |
申请公布日期 |
1991.03.21 |
申请号 |
DE19893930536 |
申请日期 |
1989.09.13 |
申请人 |
LICENTIA PATENT-VERWALTUNGS-GMBH, 6000 FRANKFURT, DE;TELEFUNKEN ELECTRONIC GMBH, 7100 HEILBRONN, DE |
发明人 |
BENEKING, HEINZ, PROF. DR.RER.NAT., 5100 AACHEN, DE |
分类号 |
H01L21/331;H01L29/737 |
主分类号 |
H01L21/331 |
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