发明名称 SLIDING CONTACT TEST APPARATUS
摘要 SLIDING CONTACT TEST APPARATUS The apparatus (20) includes electrically conductive contacts (44, 54) that are spaced apart a distance slightly less than the distance between the terminals (34, 36) formed on the components (24) to be tested. One contact (54) is held in position by a spring (112). The other contact (44) is stationary. The contacts (44, 54) slide against the terminal surfaces (52, 56) of the components (24) that are conveyed into a test location (26) between the contacts. The apparatus employs few moving parts and the sliding motion of the contacts (44, 54) against the terminal surfaces (52, 56) ensures that the contacts (44, 54) penetrate any oxide layer present on the terminal surfaces (52, 56). In an alternative embodiment (160), two sets of contacts (44L, 44T, 54L, 54T) are employed for testing components (24) in two adjacent test locations (26L, 26T). One configuration of a movable contact (304) is such that minimal force is applied to the terminal surfaces (52, 56) of the components (24) so that the components may be tested without marking or damaging the surfaces (52, 56).
申请公布号 CA2010532(A1) 申请公布日期 1991.03.21
申请号 CA19902010532 申请日期 1990.02.21
申请人 ELECTRO SCIENTIFIC INDUSTRIES, INC. 发明人 JUNGBLUT, JOHN R.;BRUNO, DAVID A.
分类号 G01R3/00;G01R31/01;(IPC1-7):G01R31/02 主分类号 G01R3/00
代理机构 代理人
主权项
地址