METHOD OF MEASURING INDEX OF REFRACTION AND THICKNESS OF THIN FILM,申请号JP19890201008-传众专利搜索

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发明名称	METHOD OF MEASURING INDEX OF REFRACTION AND THICKNESS OF THIN FILM
摘要
申请公布号	JPH0365637(A)	申请公布日期	1991.03.20
申请号	JP19890201008	申请日期	1989.08.02
申请人	RICOH CO LTD	发明人	ISOBE TAMI
分类号	G01B11/06;G01N21/21;G01N21/41	主分类号	G01B11/06
代理机构		代理人
主权项
地址

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