发明名称 |
System scan path architecture. |
摘要 |
<p>A system scan path architecture is provided by a device select module (DSM) (18) which may be used in conjunction with associated circuits (16a-b) to select secondary scan paths (PATH1-m) on each circuit for coupling with a primary scan path on a test bus (14). The test bus (14) is controlled by a primary bus master (12). Remote bus masters may be used in conjunction with the DSMs (18) to provide serial-scan testing independent of the primary bus master (12).</p> |
申请公布号 |
EP0417905(A2) |
申请公布日期 |
1991.03.20 |
申请号 |
EP19900308724 |
申请日期 |
1990.08.08 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
WHETSEL, LEE D. |
分类号 |
G06F11/22;G01R31/3185;G06F11/273;G06F13/00 |
主分类号 |
G06F11/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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