| 摘要 |
PURPOSE: To easily conduct the on-tip self-test of a VLSI with a minimum increase of the usable VLSI tip region by providing a mode control means of which each stage enables functioning of one of a plurality of modes. CONSTITUTION: The data register is constituted of a mode programmable multistep logic circuit having pseudo random number(PRN) generator of which function mode is constituted of a mode controller 33. For executing on tip self test of the VLSI circuit, the data register 10 having the function of the pseudo random number(PRN) generator is contained on a VLSI tip together with a data register 60 having a characteristics analysis(SAS) function. After inputting a multitude of a given PRN and compressing SA data, the results in the SA register are compared with 'characteristics' (logical) simulation. |
