| 摘要 |
<p>A method for continuous-wave ion beam time-of-flight mass-spectrometric analysis implemented by a corresponding device provides for directing a continuous-wave ion beam from an ion source (6) onto a means for periodical emission of ions with different mass of an ion modulator (2) in a direction perpendicular to the ion drift space (18). Then a periodical pulsed modulation of the ions with different mass is effected by means of successive accumulation of ions in the modulator (2) during the time of flight of the ions with the heaviest mass through the zone of their accumulation, and expulsion of ions with different mass by a means (7) for expulsion of ions with different mass of the ion modulator (2) from the zone of accumulation of ions with different mass, with simultaneous discontinuation of the continuous-wave beam of ions with different mass by a means (3) for periodical emission of ions with different mass for a time of their expulsion, and with subsequent acceleration of ions with different mass by a means (10) for acceleration of ions of different mass of the ion modulator (2) towards the ion drift space (18). Then packets of ions with the same mass are registered by means of an ion registration unit (21).</p> |
