发明名称 CONTACT MEMBER RELATIVE TO ELECTRICALLY CHARGED MATERIAL
摘要 <p>An oxide film having a thickness of several tens to a hundred angstroms is formed on a metal surface or at least on its portion that comes in contact with an electrically charged material, the oxide film being formed in a highly pure oxidizing atmosphere. By using this contact member, the wafer potential can be maintained to be lower than 50 V at all times yet completely preventing the wafers from being contaminated (particularly, with metal).</p>
申请公布号 WO1991003076(P1) 申请公布日期 1991.03.07
申请号 JP1990000985 申请日期 1990.08.02
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