An adapter for integrated circuit elements and a method using the adapter for testing assembled elements.

摘要

A member for assembly of IC element having a large number of connection terminals (C1 - Cn+1) and a self-test circuit (130, 81) incorporated therein, which comprises: a substrate (1) made of a film of insulating material and having a first portion (104) for defining a position of an IC element (105) to be assembled and a second portion (110) surrounding the first portion; a large number of conductive leads (11) mounted on the substrate and spaced from each other, the leads having respective inner end portions (11a) positioned in the first portion for convenience of connection to the connection terminals of the IC element when the IC element is placed in the position defined by the first portion and respective outer end portions (11b) positioned in the second portion; and a plurality of test pads (114, 115; 71c,71c min , 71c sec ) provided on the second portion and spaced from each other, wherein the number of the test pads is a limited value which is not smaller than the number of the connection terminals associated with the test circuit but irrespective of and less than the number of all the connection terminals of the IC element, the size of each test pad is at least larger than that of the outer end portion of the conductive lead, and any two of the test pads are spaced by a distance enough to assure reliability of test when the IC element is tested through the test pads. Also a method of testing the electrical connections between the connection terminals of the IC element and the conductive leads.