Semiconductor device and method and apparatus for testing the same.
摘要
<p>According to this invention, a testing apparatus including a semiconductor chip having data lines (L1 to L8) and output terminals (O1 to O8) respectively connected to the data lines and a connecting means (202) for commonly connecting an arbitrary number of ones of the output terminals includes a control means for enabling one of the plurality of data lines connected to each other by the connecting means and disabling remaining data lines and a measuring means (203) for measuring data output from the enabled data line.</p>
