发明名称 Self-aligned tungsten-filled via process and via formed thereby
摘要 Via patterns (16, 18) are applied to a first interlevel oxide layer (58) down to a metal layer (52) to define a plurality of orifices. These orifices (61, 63) are filled with tungsten by selective chemical vapor deposition. A first level conductor pattern (10, 12, 14) is then used to etch away the first insulator layer (58) and portions of plugs (62, 64) that are outside the first level conductor pattern. This first level conductor pattern is also used for a subsequent first level metal etch. The entire structure is then covered with a self-planarizing oxide layer (82), which is subsequently etched back to expose the top surfaces (66, 68) of tungsten plugs (62, 64).
申请公布号 US4996133(A) 申请公布日期 1991.02.26
申请号 US19870137389 申请日期 1987.12.23
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 BRIGHTON, JEFFREY E.;VERRET, DOUGLAS P.
分类号 H01L21/768 主分类号 H01L21/768
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