Method and apparatus for quantitative measurement of ionic and organic contaminants remaining on cleaned surfaces

摘要

An apparatus and method are used for determining the cleanliness of an electronic circuit assembly (ECA) such as printed circuit boards (PCB) following noraml cleaning and flux removal processes. The apparatus and method are used to quantitatively measure the ionic and organic contaminants remaining on an ECA. The apparatus utilizes small volumes of isopropanol, a conductivity/resistivity probe and cell and a spectrophotometric analytical instrument. The apparatus generally provides for washing the "cleaned" of defluxed ECA with a measured volume of isopropanol and thereafter measuring the ionic and organic contaminants in the wash solution. The results can then be compared to a standard.