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发明名称
TESTING APPARATUS OF SEMICONDUCTOR MEMORY
摘要
申请公布号
JPH0344583(A)
申请公布日期
1991.02.26
申请号
JP19890180950
申请日期
1989.07.12
申请人
ADVANTEST CORP
发明人
FUJISAKI KENICHI
分类号
G01R31/28;G11C29/00;G11C29/44
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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