发明名称 METHOD AND INSTRUMENT FOR NONLINEAR AVERAGING COMPENSATED MEASUREMENTS
摘要 2065018 9102945 PCTABS00003 Method and apparatus for measurement and control of an industrial process by detecting the average transmittance of a radiation beam which passes through the process material. A radiation source (28) having an intensity Io is positioned on one side of the material to be measured and a suitable radiation detector (32) is positioned on the other side. The transmitted radiation intensity, I, is measured by the sensor. An index Z commensurate with the degree of nonuniformity of the variable in the material is determined, and a process signal is generated from a quantitative relationship among I, Io, and the index Z. In a first embodiment implemented in a system for measurement and control of the basis weight of paper in a paper production process, the index Z is indicative of the nonuniformity of the material mass distribution in the sheet and is determined by measurements with a separate formation gauge operating on-line with, but independently of, the basis weight sensor. In a second embodiment of the invention implemented in such a paper making process, the index Z commensurate with the degree of nonuniformity for the mass in the material, is derived from the standard deviation of the detected radiation intensity signal, or the equivalent standard deviation of the basis weight output signal.
申请公布号 CA2065018(A1) 申请公布日期 1991.02.26
申请号 CA19902065018 申请日期 1990.08.20
申请人 ABB PROCESS AUTOMATION INC. 发明人 DUKES, JOHN R.;THOMPSON, MASON L.
分类号 D21F7/06;D21G9/00;G01G9/00;G01G17/02;G01N21/86;G01N23/16;(IPC1-7):G01D1/02 主分类号 D21F7/06
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