Method of converting a vacuum test fixture on a board testing apparatus to a mechanical test fixture

摘要

A convertible, integrated handling and testing system is described for interfacing a printed circuit board or card having electronic devices at predetermined locations thereon to a probe plate having electrical contacts at predetermined locations. A method is also described for converting a conventional vacuum test fixture to a mechanical test fixture on tester apparatus, and for converting it back to a vacuum fixture again when desired. The board handling system includes a unique conveyor system which is capable of staging one board while testing another. The conveyor system can be disengaged from one board (for testing) while another board is advanced toward the test fixture.