| 摘要 |
PURPOSE:To individually test a microcomputer core and a logic circuit part by providing first and second peripheral circuits, first to third signal lines, and a control means. CONSTITUTION:In the test mode of a microcomputer core 2, an input/output circuit 62 is coupled to a port DM1 of the microcomputer 2 by switching circuit 61 and an input/output circuit 72 is coupled to a port DM2 of the microcomputer core 2 by a switching circuit 71. Signals are inputted to and are outputted from the microcomputer core 2 through a signal line LM and a signal line LI. In the test mode of a random logic circuit 3, input/output circuits 62 and 72 are coupled to ports DR2 and DR1 of the random logic circuit 3 by switching circuits 61 and 71 respectively. Signals are inputted to and outputted from the random logic circuit 3 through signal lines LI and LR. Thus, the microcomputer core 2 and the logic circuit part 3 are individually tested. |
