发明名称 DIAGNOSTIC TEST SYSTEM FOR INFORMATION PROCESSOR
摘要 PURPOSE:To attain a diagnostic test system having high universal applicability without testing an emulator by providing a means which produces an external interruption within an information processor and simulates the input/output of the input/output data. CONSTITUTION:When an instruction is received for the diagnostic test of an external input/output control part 30, a main storage 40 decides an input/output data transfer address to the part 30 and produces an external interruption after the transfer of the input/output data. Then an arithmetic processor 10 simulates the input/output operation of the input/output data to the part 30. Thus it is possible to deal with a new external input/output device control part and an external input/output device with change of the simulation of the input/output operation without connection of the external input/output device connected to the part 30 for simulation of the input/output operation of the data or without connection of an emulator. Thus it is possible to attain a diag nostic test system having high universal applicability.
申请公布号 JPH0328936(A) 申请公布日期 1991.02.07
申请号 JP19890162975 申请日期 1989.06.26
申请人 NEC CORP 发明人 TSUCHIYA YOSHIO
分类号 G06F11/22 主分类号 G06F11/22
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