发明名称 |
SEMICONDUCTOR DEVICE AND ITS MANUFACTURE |
摘要 |
PURPOSE:To reduce a gate-drain capacitance, to obtain a high gain up to a high frequency and to reduce a noise by a method wherein a thickness of a protective film which is situated at a gate electrode and at an active region of a transistor near the electrode is made thinner than a thickness of a protective film at an inactive region of the transistor where a source lead-out electrode, a gate lead-out electrode and a drain lead-out electrode are situated. CONSTITUTION:A thickness of a protective film 17 which is situated at a gate electrode 8 and at an active region of a transistor near the electrode is made thinner than a thickness of a protective film at an inactive region of the transistor where a source extraction electrode, a gate lead-out electrode and a drain lead-out electrode for wire-bonding use are situated. Thereby, a gate-drain capacitance Cgd which is formed between the gate electrode 8 and a drain electrode 6 can be reduced; a gain in a high frequency can be enhanced. Noise which has been produced at the output side is not returned to the input side via the gate-drain capacitance Cgd as a feedback capacitance; the noise can be reduced. |
申请公布号 |
JPH0329328(A) |
申请公布日期 |
1991.02.07 |
申请号 |
JP19890163006 |
申请日期 |
1989.06.26 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
ISHIKAWA OSAMU;AZUMA CHINATSU;NISHII KATSUNORI;IKEDA YOSHITO |
分类号 |
H01L23/52;H01L21/283;H01L21/3205;H01L21/321;H01L21/338;H01L21/60;H01L29/812 |
主分类号 |
H01L23/52 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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