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发明名称
RELIABILITY TESTING METHOD FOR SEMICONDUCTOR DEVICE
摘要
申请公布号
JPH0328779(A)
申请公布日期
1991.02.06
申请号
JP19890164747
申请日期
1989.06.27
申请人
MITSUBISHI ELECTRIC CORP
发明人
YANO SHUICHI
分类号
G01R31/26;G01R31/28
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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