发明名称 Eeprom memory cell with improved protection against errors due to cell breakdown.
摘要 <p>The EEPROM memory cell with 100% redundancy includes two tunnel storage elements (10, 18; 26, 30) which are connected in parallel between a common source voltage (16) and an enabling transistor (22) which is controlled by a transfer terminal (24) and leads to a bit line (14), with respective sensing transistors (12, 28) arranged in series with respect to the storage elements. According to the invention, the cell furthermore includes an auxiliary enabling transistor (40) which is arranged in series on the source and is controlled by the transfer terminal.</p>
申请公布号 EP0411347(A2) 申请公布日期 1991.02.06
申请号 EP19900113062 申请日期 1990.07.09
申请人 SGS-THOMSON MICROELECTRONICS S.R.L. 发明人 RIVA, CARLO
分类号 G11C29/00;G11C29/04;H01L21/8247;H01L27/115 主分类号 G11C29/00
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