| 摘要 |
PURPOSE:To conduct a self test without using an LSI tester in the addition of less hardware by controlling an address generation circuit generating the address of a microinstruction with the control signal of a signal generation means generating a mode signal which is set and reset by means of the microinstruction. CONSTITUTION:When a start microinstruction for starting the self test is accessed, the mode signal is set and the address generation circuit 54 is controlled by the mode signal. Then, the microinstruction of a microinstruction storage part 55 is sequentially read. When a termination microsignal is read, the mode signal is reset, and the self test terminates. Consequently, the execution of the self test can be dealed as one routine program of the microprogram. Thus, the processor can be easily used on a mounted substrate without using the LSI tester in the addition of less hardware. |
