| 摘要 |
The contact arrangement has a number of metallic contact elements each with a linearly guided straight pin the front end of which contacts the test object. The pins are forced onto the test object by coaxial helical springs attached to the pins and a counter contact surface on a supporting plate at either end. The helical springs (15) protrude rearwards over the pins (12). Each counter contact surface is an end surface of a small, special metallic counter contact (20) which is fixed onto the supporting plate (19).
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