发明名称 Method of producing semiconductor device.
摘要 <p>The method of forming electrical interlayer contact in a semiconductor device. An insulating film is formed on a first electroconductive layer and then a contact hole is formed in the insulating film to expose a part of the first electroconductive. An activated surface of the exposed part is formed in the contact hole. A gas containing an impurity component is supplied to form an impurity adsorption film on the activated surface. The contact hole is filled with a second electroconductive layer to form electrical contact between the first and second electroconductive layers through the contact hole.</p>
申请公布号 EP0410390(A2) 申请公布日期 1991.01.30
申请号 EP19900114183 申请日期 1990.07.24
申请人 SEIKO INSTRUMENTS INC. 发明人 INOUE, NOATO, C/O SEIKO INSTRUMENTS INC.;AOKI, KENJI, C/O SEIKO INSTRUMENTS INC.;HOSAKA, TAKASHI, C/O SEIKO INSTRUMENTS INC.
分类号 H01L21/225;H01L21/285;H01L21/60;H01L21/768 主分类号 H01L21/225
代理机构 代理人
主权项
地址