发明名称 |
Method of producing semiconductor device. |
摘要 |
<p>The method of forming electrical interlayer contact in a semiconductor device. An insulating film is formed on a first electroconductive layer and then a contact hole is formed in the insulating film to expose a part of the first electroconductive. An activated surface of the exposed part is formed in the contact hole. A gas containing an impurity component is supplied to form an impurity adsorption film on the activated surface. The contact hole is filled with a second electroconductive layer to form electrical contact between the first and second electroconductive layers through the contact hole.</p> |
申请公布号 |
EP0410390(A2) |
申请公布日期 |
1991.01.30 |
申请号 |
EP19900114183 |
申请日期 |
1990.07.24 |
申请人 |
SEIKO INSTRUMENTS INC. |
发明人 |
INOUE, NOATO, C/O SEIKO INSTRUMENTS INC.;AOKI, KENJI, C/O SEIKO INSTRUMENTS INC.;HOSAKA, TAKASHI, C/O SEIKO INSTRUMENTS INC. |
分类号 |
H01L21/225;H01L21/285;H01L21/60;H01L21/768 |
主分类号 |
H01L21/225 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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