发明名称 Window taper-etching method in the manufacture of integrated circuit semiconductor devices.
摘要 <p>In a two-step etching process for making tapered contact openings in a dielectric (11), a thin layer of a material (12) is interposed to serve as an adhesive between the dielectric and a photoresist layer (13); such material is chosen to remain essentially intact during undercut partial etching of the dielectric. As a result of enhanced adhesion, the photoresist layer remains more accurately positioned for subsequent isotropic etching across the remainder of the thickness of the dielectric.</p>
申请公布号 EP0410635(A1) 申请公布日期 1991.01.30
申请号 EP19900307848 申请日期 1990.07.18
申请人 AMERICAN TELEPHONE AND TELEGRAPH COMPANY 发明人 CHEW, HONGZONG;FIEBER, CATHERINE ANN;HILLS, GRAHAM WILLIAM;MARTIN, EDWARD PAUL, JR.
分类号 G03F7/26;H01L21/027;H01L21/28;H01L21/30;H01L21/302;H01L21/3065;H01L21/311;H01L21/338;H01L21/768;H01L29/812 主分类号 G03F7/26
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