发明名称 |
Window taper-etching method in the manufacture of integrated circuit semiconductor devices. |
摘要 |
<p>In a two-step etching process for making tapered contact openings in a dielectric (11), a thin layer of a material (12) is interposed to serve as an adhesive between the dielectric and a photoresist layer (13); such material is chosen to remain essentially intact during undercut partial etching of the dielectric. As a result of enhanced adhesion, the photoresist layer remains more accurately positioned for subsequent isotropic etching across the remainder of the thickness of the dielectric.</p> |
申请公布号 |
EP0410635(A1) |
申请公布日期 |
1991.01.30 |
申请号 |
EP19900307848 |
申请日期 |
1990.07.18 |
申请人 |
AMERICAN TELEPHONE AND TELEGRAPH COMPANY |
发明人 |
CHEW, HONGZONG;FIEBER, CATHERINE ANN;HILLS, GRAHAM WILLIAM;MARTIN, EDWARD PAUL, JR. |
分类号 |
G03F7/26;H01L21/027;H01L21/28;H01L21/30;H01L21/302;H01L21/3065;H01L21/311;H01L21/338;H01L21/768;H01L29/812 |
主分类号 |
G03F7/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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