| 摘要 |
PURPOSE: To execute a boundary test in an operation mode of an IC, by storing and logically operating arriving data by a logic circuit connected between an input and an output circuits of the IC, and comparing the data with estimation data. CONSTITUTION: Arriving data are stored, logically operated, etc., by a logic circuit connected between a data input D0-7 and a data output Q0-7 of an IC. The data are analyzed and stored by an input and an output test registers(TCR) 12, 22 when a predetermined state is detected. At this time, the predetermined state can be detected by comparing data from the logic circuit with a stored estimation data word. On the occasion of a boundary test, test data are shifted into a test circuit of the TCR 22 under the control from a test port 48. An event recognition module 30 generates a control in accordance with an input of the predetermined state via a CTERM signal, and outputs a test pattern to the output Q0-7. Accordingly, data passing a boundary of the IC can be dynamically observed. |
