首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
PARAMETER MEASURING INSTRUMENT FOR CHARACTERISTIC DETERIORATION MODEL OF SEMICONDUCTOR ELEMENT BY IRRADIATION WITH RADIATION
摘要
申请公布号
JPH0318773(A)
申请公布日期
1991.01.28
申请号
JP19890152375
申请日期
1989.06.16
申请人
HITACHI LTD
发明人
KAMIMURA HIROSHI
分类号
G01R31/26
主分类号
G01R31/26
代理机构
代理人
主权项
地址
您可能感兴趣的专利
Heterocyclic compounds.
Pharmaceutical composition containing thymus extract fractions.
Gas monitor circuits.
MULTI-STEP CONVEYOR COMPRISING A LOADING STATION, A VERTICAL CONVEYOR AND A DISPENSING DEVICE FOR BULK MATERIAL
HYDROSILAZANE POLYMERS FROM (R3SI)2NH AND HSICL3
HEIGHT-ADJUSTABLE TABLE CONSTRUCTION
DIGITAL DYNAMIC RANGE CONVERTER
ARRANGEMENT FOR THE REDUCTION OF THE EROSIVE INFLUENCE OF ROUGH WATERS ON THE MARGINAL SURFACES BETWEEN WATER AND LAND AND/OR FOR THE RECLAMATION OF LAND
BRUSH CONTROL MEANS
CONTINUOUS SPEECH RECOGNITION SYSTEM
ROTARY GANG VARIABLE RESISTOR
TWO-STROKE ENGINE WITH CONTROLLED VALVES.
CAPACITANCE-TYPE SWITCH.
AVIAN ENCEPHALOMYELITIS ANTIBODY DETECTION.
PROCESS FOR OPERATING A PROXIMITY FUSE, AND DEVICE FOR THE IMPLEMENTATION OF THE PROCESS.
GALVANISCHE ZELLE
Biaxially oriented coextruded multilayer foil.
Expander system for pulse signals.
Evaporator for liquid fuel to generate a fuel-air mixture.
Process for preparing elastic melamine foams.