发明名称 REDUCING-PROJECTION EXPOSURE APPARATUS
摘要 PURPOSE:To prevent the defect of a reticle securely and to operate an apparatus efficiently by providing a reticle storing device, an inspecting device for particles on the surface of a pellicle, a particle removing device and an automatic reticle conveying device. CONSTITUTION:A main body 1 of a reducing-projection exposure apparatus, a reticle storing device 2, a pellicle-surface-particle inspecting device 3, a pellicle- surface-particle removing device 4, and an automatic reticle conveying device 5 for conveying the reticle automatically between the devices are provided. When the reticle which is used in this constitution is judged as fail by the inspection conducted with the pellicle-surface-particle inspecting device 3, the reticle is quickly sent into the pellicle-surface-particle removing device 4 by automatic conveyance. The particle is removed securely. The reticle is conveyed to the pellicle-surface-particle inspecting device 3 again. When the reticle passes the inspection, the reticle is sent into the reducing-projection exposure apparatus (a). Thus, the reducing-porjection exposure apparatus can be operated efficiently without the occurrence of defects.
申请公布号 JPH0318011(A) 申请公布日期 1991.01.25
申请号 JP19890151921 申请日期 1989.06.14
申请人 MATSUSHITA ELECTRON CORP 发明人 SHIMADA OSAMU
分类号 H01L21/027;G03F7/20;H01L21/30 主分类号 H01L21/027
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