发明名称 SURFACE MICROSCOPE
摘要 PURPOSE:To accurately measure the tunnel barrier distribution of the surface of a sample by providing a means which measures the surface shape of the sample by detecting a tunneling current, a means which excites a probe or the sample at right angles to the surface of the sample, and a means which measures tunnel barrier information by dividing the variation of the tunnel current by the tunneling current. CONSTITUTION:The probe 1 which is set nearby opposite the surface of the sample 2 is excited by DELTAS in a Z-axis direction by using a Z-axis piezoelectric element 3. Consequently, the tunneling current I and its variation quantity DELTAI are measured by a current detector 4 and an error detector 5 and a divider 6 obtains the value DELTAI/I. Its amplitude quantity is detected by a synchronous rectifying circuit or lock-in amplifier 7 and multiplied by a specific value to accurately obtain tunnel barrier (psi<1/2>) information.
申请公布号 JPH0312503(A) 申请公布日期 1991.01.21
申请号 JP19890145329 申请日期 1989.06.09
申请人 HITACHI LTD 发明人 HOSAKA SUMIO;HOSOKI SHIGEYUKI;HASEGAWA TAKESHI
分类号 G01B7/34;G01B7/00;G01D21/02;G01N27/00;G01N27/02;G01N37/00;G01Q30/04;G01Q60/04;G01Q60/10;G01Q60/24;G01R31/302;H01J37/00;H01J37/28 主分类号 G01B7/34
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