发明名称 TREATING METHOD OF SURFACE AND MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To make it possible to make the corner part of a projection gentle and also to make a surface smooth in a second etching process by making the ratio of flow rate of a second gas to that of a first gas in this process larger than in a first etching process. CONSTITUTION:In a first etching process wherein the ratio of flow rate of a second gas containing oxygen to that of a first gas containing a halogen element is made large in some degree, the angular part of a recession is made gentle efficiently by a little amount of etching. Thereafter, the ratio of flow rate of the second gas to that of the first gas is made larger than that in the first etching process and the corner part of a projection is made gentle efficiently in a second etching process. Since the ground is not exposed according to this method, no deterioration of the ground takes place and a smooth surface can be obtained.
申请公布号 JPH0311629(A) 申请公布日期 1991.01.18
申请号 JP19890145757 申请日期 1989.06.08
申请人 TOSHIBA CORP 发明人 NISHINO HIROTAKE;ARIKADO TSUNETOSHI;OKANO HARUO
分类号 H01L21/302;H01L21/3065;H01L21/822;H01L21/8242;H01L27/04;H01L27/10;H01L27/108 主分类号 H01L21/302
代理机构 代理人
主权项
地址