发明名称 Apparatus for automatic measurement of the reflectance of vitrinite
摘要 <p>An apparatus for automatic measurement of the reflectance of vitrinite comprises an image input part comprising an object-holder plate 1 intended to receive an object sample 2 to be measured, an objective (lens) 3 for providing an enlarged (magnified) image of an object sample, an epiprism device 5 supplemented by a light source device 4, and a television camera 9 taking an image of the object sample 2 to be measured, an image processing part comprising an analog/digital converter 10, an image memory 11 and an image processor 12, both connected to the analog/digital converter 10, and a control part comprising a data medium 21 containing a polished-particle image extraction program, a fine-texture part removal program, a luminance measurement program, a sequence control program for the execution of the programs, and a basic program, and furthermore having a memory (storage) region for the measurement results, a control processor 16 and a data medium input/output device 22 connected to the data medium 21 and to the control processor 16, the television camera 9 contained in the image input part being connected to the analog/digital converter 10 contained in the image processing part, and the control processor 16 contained in the controlled part being connected to the image processor 12 contained in the image processing part.</p>
申请公布号 FR2649794(A1) 申请公布日期 1991.01.18
申请号 FR19900008683 申请日期 1990.07.09
申请人 SEKIYUSHIGEN KAIHATSU KK 发明人 HIROSHI KURITA
分类号 G01N21/17;G01N15/14;G01N21/47;(IPC1-7):G01N21/55 主分类号 G01N21/17
代理机构 代理人
主权项
地址