| 摘要 |
For optical monitoring of a knitted article for faults during the manufacture thereof in a knitwear processing machine, the knitted article is scanned line by line by the optical scanner. The scan signals generated in the process are delivered to a digital processing circuit. In a reference mode, the scan signals are stored as pattern signals in the digital processing circuit. In a subsequent operating mode during manufacture of the knitted article, the scan signals are compared as operating scan signals with the pattern signals corresponding to the scan position, to check if they match. If they do not match, a fault signal is generated.
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