发明名称 |
Collimated metal deposition. |
摘要 |
<p>A process and structure for depositing metal lines in a lift-off process is disclosed. The process provides the deposition of a four-layer structure or lift-off stencil, comprising a first layer (12) of a lift-off polymer etchable in oxygen plasma, a first barrier layer (14) of hexamethyldisilizane (HMDS) resistant to an oxygen plasma, a second lift-off layer (16) and a second barrier layer (18). Once these layers are deposited, a layer (20) of photoresist is deposited and lithographically defined with the metal conductor pattern desired. The layers are them sequentially etched with oxygen and CF4, resulting in a dual overhang lift-off structure. Metal (26, 24) is then deposited by evaporation or sputtering through the lift-off structure. Following metal deposition, the lift-off structure is dissolved or lifted-off in a solvent such as N-methylpyrrolidone (NMP).</p> |
申请公布号 |
EP0406544(A2) |
申请公布日期 |
1991.01.09 |
申请号 |
EP19900108998 |
申请日期 |
1990.05.12 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
MATHAD, GANGADHARA SWANI;STANASOLOVICH, DAVID;VIA, GIORGIA GIULIO |
分类号 |
H01L21/3205;H01L21/311;H01L21/768 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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