发明名称 Semiconductor memory device having transfer gates coupled between bit line pairs and sense amplifier circuits
摘要 A semiconductor memory device of the type having a pair of transfer gates between a bit line pair and an interconnection pair coupled to a sense amplifier circuit operates at a high speed because of the reduction of parasitic capacitances coupled to the sense amplifier circuit, however, the sense amplifier circuit is so sensitive to an electrical unbalance between the input nodes thereof that a transfer signal line is coupled to the gate electrodes of the transfer gates through a contact window located in such a manner that coupling capacitances between the transfer signal line and the interconnections do not provide the electrical unbalance, then the contact window is by way of example located between the interconnections.
申请公布号 US4984197(A) 申请公布日期 1991.01.08
申请号 US19890442760 申请日期 1989.11.29
申请人 NEC CORPORATION 发明人 SAKAGAMI, TAKAKO
分类号 G11C11/401;G11C11/409;G11C11/4091;G11C11/4096;H01L21/8242;H01L27/10;H01L27/108 主分类号 G11C11/401
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