发明名称 Micrometer for use in severe operating conditions
摘要 <p>A micrometer for use to determine the change in dimensions of a sample due to the application of stress and which is unaffected by the ambient conditions of radiation and high temperature within a nuclear reactor. Two sensors are used, one in contact with an unstressed standard sample and the second in contact with a sample under stress. Each is linked to a magnetic core surrounded by a transformer coil. The two coils are mounted on a single hollow nut which is moved longitudinally by an electrically driven screw. The sample changes due to the stress as determined by the measurement of the movement of the nut between the minimum output positions of the two transformers.</p>
申请公布号 FR2064761(A5) 申请公布日期 1971.07.23
申请号 FR19690037181 申请日期 1969.10.29
申请人 CEA 发明人
分类号 G01B3/18;G01B7/24;G21C17/10;(IPC1-7):01B7/00;01B3/00;21C17/00 主分类号 G01B3/18
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