发明名称 Process for the manufacture of III-V semiconductor devices
摘要 PCT No. PCT/GB87/00208 Sec. 371 Date Jan. 12, 1989 Sec. 102(e) Date Jan. 12, 1989 PCT Filed Mar. 26, 1987 PCT Pub. No. WO87/06061 PCT Pub. Date Oct. 8, 1987.A process for the manufacture of a transistor device of the type having active regions e.g. an emitter (17) and a base (11) each contacted by isolated extended conductive regions (37, 33) respectively. At start of process a mesa structure is defined in layered III-V material (3, 5, 11 and 13). The sidewall of the mesa is covered by a conformal coating (27) of insulating material; and, lattice matched material (33) grown on the exposed adjacent material (25) to form a first extended contact. This then is covered by a further layer (35) of insulating material (35). The second extended contact (37) is then grown over the mesa active region material (13). This contact material (37) is isolated from the first contact material (33) by the remanent insulating material (27, 35). This process is applicable to the GaAs/GaAlAs III-V material system as also other material systems. Transistor devices produced by this process may be either bipolar or field-effect type.
申请公布号 US4981808(A) 申请公布日期 1991.01.01
申请号 US19890298881 申请日期 1989.01.12
申请人 PLESSEY OVERSEAS LIMITED 发明人 HAYES, ROGER C.
分类号 H01L21/285;H01L21/335;H01L21/338;H01L21/768;H01L29/72;H01L29/737;H01L29/778;H01L29/80;H01L29/808 主分类号 H01L21/285
代理机构 代理人
主权项
地址