发明名称 AMPLITUDE LEVEL CHARACTERISTIC MEASURING CIRCUIT
摘要 <p>PURPOSE:To measure an amplitude level characteristic by incorporating a synchronizing signal in a test signal at a specific period and detecting the output of an image encoding device corresponding to the synchronizing signal. CONSTITUTION:A variable amplitude generating means 1 generates a variable amplitude. A synchronizing signal pattern generating means 2 generates a synchronizing signal pattern at a specific period. A selecting means 3 selects the output of the variable amplitude generating means 1 normally, but selects the output of a synchronizing signal pattern generating means 2 when the synchronizing signal pattern generating means 2 generates the effective output, thereby sensing the selected output to an image encoding device. The test signal contains the synchronizing signal at the specific period between horizontal signals with a constant DC level (amplitude). For the measurement of the amplitude characteristic, respective input amplitude levels are compared with corresponding output amplitude levels while varied at intervals of several lines according to several head lines as a reference level.</p>
申请公布号 JPH02309787(A) 申请公布日期 1990.12.25
申请号 JP19890130029 申请日期 1989.05.25
申请人 FUJITSU LTD 发明人 KAWAKADO KOSUKE;HANABATAKE TOSHIO;WADA NOBUYUKI;SAKATA TAKASHI
分类号 H04N19/00;H04N17/00;H04N19/70;H04N19/85 主分类号 H04N19/00
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