发明名称 |
Microcircuit probe and method for manufacturing same |
摘要 |
An electrically conductive probe of controlled shape and dimension useful in testing the functionality and performance of microcircuits and a method for manufacturing it are disclosed. The probe may be generally square or rectangular in cross section and consists of three distinct sections; the terminal end which is capable of being electrically contacted, the shaft which connects the terminal end to the probe tip, and the probe tip which is to make electrical contact with a microcircuit.
|
申请公布号 |
US4980638(A) |
申请公布日期 |
1990.12.25 |
申请号 |
US19890358303 |
申请日期 |
1989.05.26 |
申请人 |
DERMON, JOHN A.;TRENARY, DALE T. |
发明人 |
DERMON, JOHN A.;TRENARY, DALE T. |
分类号 |
G01R1/067 |
主分类号 |
G01R1/067 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|