| 摘要 |
<p>PURPOSE:To provide self-corrective capability to the defective picture element and to eliminate the need for the inspection and correction of defects by connecting all the gate electrodes to a scanning signal conductor and connecting the source electrodes at the one ends so that plural serial transistor arrays connected to the picture signal conductor are connected in parallel between the scanning signal conductor and the picture signal conductor. CONSTITUTION:Six serial transistor arrays 4, for example, are connected in parallel in eight rows, and hence 48 transistors are used in one picture element. The gate electrode or source/drain electrode of each transistor has a low allowable current density and is refined to be easily cut by an overcurrent, and the film is also sufficiently thinned. Accordingly, even if a short circuit is caused between the gate and source of the transistor or between the gate and drain in the production and assembly stages, the transistor is automatically disconnected. Consequently, the defective transistor is disconnected without need for the inspection and correction of defects, and all the picture elements are normally actuated.</p> |
