发明名称 TIMBER DEFECT ANALYSIS BY X-RAY: OPTIMAL PIECES CUT
摘要 <p>A lumber optimizer system that detects the wane in a flitch being processed and by using a plurality of discrete detectors detecting the amount of electromagnetic radiation passing through localized areas of the board to determine the local differences in density provides a density profile of the flitch. The developed data are accumulated as the flitch traverses the detectors and processed in a computer to provide a profile of signal strengths generated by the detectors and used to generate an image of varying intensity depending on the signal (density) for each discrete area of the flitch and provide a density map of the field. The map so produced is analyzed in conjunction with the detected wane to determine the defects in the flitch and the nature and the position of such defects in the flitch and provide a plan of the flitch wherein the locations of good wood, and various defects are provided. This plan is then used to determine the sawing solution for the flitch and to adjust the position of a positioning system to position the flitch for sawing in accordance with the sawing solution. The saws are also adjusted in accordance with the sawing solution and an overall control computer is provided to control asynchronous operation of the sensors, computers and adjusters to ensure that the operations of these units are controlled in accordance with the location of the flitch as it travels through the system. This system permits the determination of a sawing solution and the setting of the saws in a time span permitting realistic production rates from the system.</p>
申请公布号 NZ226540(A) 申请公布日期 1990.12.21
申请号 NZ19880226540 申请日期 1988.10.12
申请人 MACMILLAN BLOEDEL LTD 发明人 AUNE, JAN ERIK;ARDEN, TERENCE JAMES;YAP, MARY SHARLENE
分类号 B27B31/06;B07C5/34;B23D59/00;B27B1/00;B27G1/00;G06Q10/04;(IPC1-7):B27B1/00;G01N23/18;B27B31/00 主分类号 B27B31/06
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