发明名称 Device for measuring a force using extensometric (strain) gauges stressed normally to their surface
摘要 The invention relates to a device for measuring a force using strain gauges deposited on an insulating substrate (support) and stressed by the force to be measured normally to their surface. It consists of the insulating substrate 1 on which at least one gauge J is deposited by one of the known deposition methods. The force F to be measured is introduced in the gauge via a cushion (pad) 3 consisting of a deformable material, preferably an elastic material, contained in a support component 2 made in a rigid material. The device according to the invention is intended for measuring the force generated by a mass and an acceleration, by a pressure integrated by a membrane or by the deformation of an elastic element. <IMAGE>
申请公布号 FR2648559(A1) 申请公布日期 1990.12.21
申请号 FR19890008000 申请日期 1989.06.16
申请人 HAMBURGER NICOLAS 发明人
分类号 G01L1/20 主分类号 G01L1/20
代理机构 代理人
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