发明名称 |
Fabricating electrical contacts in semiconductor devices. |
摘要 |
<p>A method of fabricating an electrical contact in a semiconductor device, the method comprising the steps of:- (a) providing on an underlying silicon substrate (2) a reflowable interlevel dielectric material (14) having a contact opening exposing a contact region of the silicon substrate; (b) heating the silicon substrate and the interlevel dielectric material by a rapid thermal anneal in an oxygen-containing atmosphere thereby to grow an oxide control layer (20) in the contact region and to reflow the dielectric material; (c) depositing a layer of transition metal (28) over the reflowed dielectric material and the control layer; and (d) converting at least part of the transition metal layer into a metallurgic barrier. t</p> |
申请公布号 |
EP0403050(A2) |
申请公布日期 |
1990.12.19 |
申请号 |
EP19900302870 |
申请日期 |
1990.03.16 |
申请人 |
INMOS LIMITED |
发明人 |
HUNT, PAUL ANTHONY;LILES, IAN MICHAEL;GUITE, DAVID RALPH |
分类号 |
H01L21/768;H01L21/28;H01L21/3105 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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