发明名称 Fabricating electrical contacts in semiconductor devices.
摘要 <p>A method of fabricating an electrical contact in a semiconductor device, the method comprising the steps of:- (a) providing on an underlying silicon substrate (2) a reflowable interlevel dielectric material (14) having a contact opening exposing a contact region of the silicon substrate; (b) heating the silicon substrate and the interlevel dielectric material by a rapid thermal anneal in an oxygen-containing atmosphere thereby to grow an oxide control layer (20) in the contact region and to reflow the dielectric material; (c) depositing a layer of transition metal (28) over the reflowed dielectric material and the control layer; and (d) converting at least part of the transition metal layer into a metallurgic barrier. t</p>
申请公布号 EP0403050(A2) 申请公布日期 1990.12.19
申请号 EP19900302870 申请日期 1990.03.16
申请人 INMOS LIMITED 发明人 HUNT, PAUL ANTHONY;LILES, IAN MICHAEL;GUITE, DAVID RALPH
分类号 H01L21/768;H01L21/28;H01L21/3105 主分类号 H01L21/768
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