发明名称 |
Chip carrier socket test probe |
摘要 |
A test probe for use with a chip carrier socket including electrical connections to an external testing device and contacts to engage matching contacts within the chip socket. Tong-like elements grasp the socket to insure both mechanical and electrical integrity of the connections. A slip ring retains the tongs and probe in operated position.
|
申请公布号 |
US4978912(A) |
申请公布日期 |
1990.12.18 |
申请号 |
US19890427278 |
申请日期 |
1989.10.23 |
申请人 |
AG COMMUNICATION SYSTEMS CORPORATION |
发明人 |
VONDER, DAVID L.;REIMER, WILLIAM A. |
分类号 |
G01R1/04 |
主分类号 |
G01R1/04 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|