发明名称
摘要 PURPOSE:To prevent the plating deposition to cathode pins and the generation of conduction failure by a method wherein a plating device is provided with liquid-guard walls. CONSTITUTION:Points of contact of cathode pins 3 in the periphery of a wafer 2 are provided with photo resist apertures 2a, which are made as plating cathode lead-out parts. On the other hand, the plating device is provided with liquid- guard walls 5 so that the pins 3 do not come into contact with the overflown plating liquid, at the parts where the pins 3 project out of the upper end outer periphery 6 of the plating bath into the bath, in the outer end outer periphery 6 to which the plating liquid of the plating bath overflows. At the time of installing this wafer 2 to the plating device, the wafer 2 is overlapped with the walls 5 in such a manner that its apertures 2a do not contact the plating liquid, so that the pins 3 may abut against the apertures 2a. This manner allows no deposition of plating to the pins 3 and does not generate plating failure due to poor conduction of the wafer 2 with the pins 3.
申请公布号 JPH0260059(B2) 申请公布日期 1990.12.14
申请号 JP19840146589 申请日期 1984.07.13
申请人 SHARP KK 发明人 HAYAKAWA MASAO;MAEDA TAKAMICHI;MORI KATSUNOBU
分类号 H01L21/60 主分类号 H01L21/60
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