| 摘要 |
According to the invention, the mass spectrometer comprises means for focusing the beam of ions from the sample, first mass analysis means having a first quadrupole Q1 supplied with RF and DC, placed directly between the focusing means and postfiltering means P0 extending the quadrupole structure, but supplied solely with RF, a surface collision chamber CC for supplying a new beam of daughter ions and means MT for processing this new beam of ions, comprising at the head a second quadrupole Q2 supplied with RF and DC, immediately preceded by prefiltring means 2PR in front of the quadrupole structure but supplied solely with RF and followed by detection means MD. <IMAGE>
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