| 摘要 |
A method of testing conductor networks which makes it possible to test printed circuit boards and wiring modules which have relatively low resistances that cause part of the network to be discharged due to tracking currents and a secondary electron signal measured in the associated region which simulates an interruption in the circuit that is in fact not present wherein for compensation of charge losses, the conductor network is scanned during the measurement with a large area second electron beam. |
