发明名称 Method of forming pattern and apparatus for implementing the same
摘要 Prior to etching by an etchant, a low concentration solution of cerium ammonium nitrate [(NH4)2Ce(NO5)6] is caused to adhere onto an electron-beam resist pattern, thus to improve hydrophilic property of the resist pattern. As a result, a metal thin film is etched in conformity with the resist pattern. Thus, a fine pattern of the metal thin film is provided.
申请公布号 US4976810(A) 申请公布日期 1990.12.11
申请号 US19900489231 申请日期 1990.03.06
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 MASUDA, SATOSHI;SHIGEMITSU, FUMIAKI;USUDA, KINYA
分类号 C23F1/02;C23F1/26;G03F7/40 主分类号 C23F1/02
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