发明名称 |
Method of forming pattern and apparatus for implementing the same |
摘要 |
Prior to etching by an etchant, a low concentration solution of cerium ammonium nitrate [(NH4)2Ce(NO5)6] is caused to adhere onto an electron-beam resist pattern, thus to improve hydrophilic property of the resist pattern. As a result, a metal thin film is etched in conformity with the resist pattern. Thus, a fine pattern of the metal thin film is provided.
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申请公布号 |
US4976810(A) |
申请公布日期 |
1990.12.11 |
申请号 |
US19900489231 |
申请日期 |
1990.03.06 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
MASUDA, SATOSHI;SHIGEMITSU, FUMIAKI;USUDA, KINYA |
分类号 |
C23F1/02;C23F1/26;G03F7/40 |
主分类号 |
C23F1/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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