BIAS TESTING BOARD FOR SEMICONDUCTOR DEVICE,申请号JP19890116117-传众专利搜索

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发明名称	BIAS TESTING BOARD FOR SEMICONDUCTOR DEVICE
摘要
申请公布号	JPH02296163(A)	申请公布日期	1990.12.06
申请号	JP19890116117	申请日期	1989.05.11
申请人	NEC CORP	发明人	FUKUSHIMA YOSHINOBU
分类号	G01R31/26;H01L21/66	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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