| 摘要 |
PURPOSE:To realize a test in a short time and at a low cost by providing respective circuits such as the circuit which switches an internal output signal to an input buffer output signal, the circuit which latches the signal and supplies it to an output buffer and the circuit which switches an input/output control signal to an exterior signal. CONSTITUTION:The output terminal of the output buffer 14 and the input terminal of an input buffer 15 are connected to an input/output terminal 13. A semiconductor integration circuit consists of the circuit multiplexer 4 which switches a signal 2 outputted by a host circuit inside to a signal 3 outputted by the buffer 15 with the aid of a test signal 1, the latch circuit 6 which latches the signal 5 and inputs it to the output buffer 14 and the circuit multiplexer 8 which switches the input/output control signal 11 to a control signal 16 by the signal 1. Then, the desired signal is inputted in the meantime of input timing and the respective characteristics of the buffers 14 and 15 are judged and evaluated in the meantime of output timing. Thus, the input and the output buffer can be easily tested by one test mode. |
