发明名称 METHOD AND INSTRUMENT FOR EXECUTING CRYSTALLOGRAPHIC QUALITY TEST OF OBJECT WITH SINGLE CRYSTAL STRUCTURE BY KIKUCH LINE GENERATION IN NORMAL ATOMOSPHERE
摘要 PURPOSE: To form an image of Kikuchi lines of single crystal structure object in the atmosphere by pouring an electron beam to a single crystal structure in the ordinary atmosphere. CONSTITUTION: An object 12 is set in the means 11 of an indexing rotary plate 10. An electronic controller 17 operates a manipulator 13 to take out the object 12 and guides the object 12 to a fixed position in front of a micro beam source F having diameter of 100μm or less. A fluorescent face 9 is guided in front of a luminance amplifier 6 and an X-ray generator 4 is fed with energy. Photons emitted from the generator 4 is diffracted upon striking against the crystal of single crystal structure in the object 12 and a diaphragm image composed of Kikuchi lines is floated on the surface 9. When an operator observes the image on the surface 9 and the orientation of the object 12 is altered by means of a manipulator 13, a new image can be observed. When no defect is detected, the surface 9 is drawn out and an assembly (amplifier 6, video image pickup unit 7) 5 is operated to pick up the diaphragm image which is then processed by means of a computer using an appropriate software.
申请公布号 JPH02290544(A) 申请公布日期 1990.11.30
申请号 JP19900041407 申请日期 1990.02.23
申请人 TAABOMEKA 发明人 MITSUSHIERU MURUTAN
分类号 G01N23/20;G01N23/227 主分类号 G01N23/20
代理机构 代理人
主权项
地址